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Optimum Constant-Stress Partially Accelerated Life Test Plans with Type-II Censoring: The Case of Weibull Failure Distribution

Ali A. Ismail


This paper deals with simple constant-stress partially accelerated life tests with type-II censoring. It is assumed that the lifetime at design stress has Weibull distribution. The paper studies numerically the dependence between allocations of observations and the actual values of the probability model parameters. The maximum likelihood estimators of the model parameters are considered. Partially accelerated life test plans are developed such that the generalized asymptotic variance of the maximum likelihood estimators of the model parameters is minimized. The plan is to specify the fraction of test units that should be allocated to run under use condition. For illustration, simulation studies are introduced.


Reliability; Partially Accelerated Life Tests; Weibull distribution, constant-stress

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